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SURFACE MORPHOLOGY AND STRUCTURAL PROPERTIES OF ZNS AND ZNS:AL THIN FILMS

Eman M. Nasir

Un doped and doped with Al ZnS thin Films have been fabricated by vacuum evaporation technique under the vacuum of 10-5 Torr on glass substrate at room temperature and with different ratio of Al concentration of thickness (0.8μm). Structure of these films was characterized by X-ray diffraction and Atomic force microscope. The structures of these films grown on glass substrate are in cubic zinc-blende phase and textured along (111) plane. The crystallite size increases from 68.02 to 215.8 nm as the Al concentration increased from pure to 2% Al. The grain size is increase with increasing of Al concentration the surface roughness of the films is decrease with increasing of Al concentration